Normal view MARC view ISBD view

Design for test for digital IC's and embedded core systems

Crouch, Alfred L.

Design for test for digital IC's and embedded core systems - New Delhi Pearson 1999 - 349 p

ISBN: 9788131717899

Subjects--Topical Terms:
Electronic Engineering

LC Class. No.: 621.3815 CRO 1999

Dewey Class. No.: 621.3815 CRO 1999

National Library of Medicine Call No.: 621.3815 CRO 1999

Place hold
Print
Add to your cart (remove)
Send to device
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)