Crouch, Alfred L. <br/><br/>
Design for test for digital IC's and embedded core systems 

 - New Delhi  Pearson  1999 
 - 349 p 
<br/><br/><label>ISBN: </label>9788131717899 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electronic Engineering
<br/><br/><label>LC Class. No.: </label>621.3815 CRO 1999 
<br/><br/><label>Dewey Class. No.: </label>621.3815 CRO 1999 
<br/><br/><label>National Library of Medicine Call No.: </label>621.3815 CRO 1999