TY  - BOOK
AU  - Crouch, Alfred L.
AU  - Crouch, Alfred L.
TI  - Design for test for digital IC's and embedded core systems
SN  - 9788131717899
AV  - 621.3815 CRO 1999 
U1  - 621.3815 CRO 1999 
PY  - 1999///
CY  - New Delhi
PB  - Pearson
KW  - Electronic Engineering
ER  -