Sharma, Ashok K <br/><br/>
Semiconductor memories technology, testing, and reliability 

 - New Delhi  Prentice, hall of India  1997 
 - 462 p 
<br/><br/><label>ISBN: </label>9788120316836 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electronic Engineering
<br/><br/><label>LC Class. No.: </label>621.38152 SHA 1997 
<br/><br/><label>Dewey Class. No.: </label>621.38152 SHA 1997 
<br/><br/><label>National Library of Medicine Call No.: </label>621.38152 SHA 1997