TY  - BOOK
AU  - Sharma, Ashok K
AU  - Sharma, Ashok K
TI  - Semiconductor memories technology, testing, and reliability
SN  - 9788120316836
AV  - 621.38152 SHA 1997 
U1  - 621.38152 SHA 1997 
PY  - 1997///
CY  - New Delhi
PB  - Prentice, hall of India
KW  - Electronic Engineering
ER  -