000 00548nam a2200205Ia 4500
001 12088
008 220704s1999 ||||||||||||||||| || u
020 _a9788131717899
050 _a621.3815 CRO 1999
060 _a621.3815 CRO 1999
082 _a621.3815 CRO 1999
100 _aCrouch, Alfred L.
245 0 _aDesign for test for digital IC's and embedded core systems
260 _aNew Delhi
_bPearson
_c1999
300 _a349 p
365 _b3.3
_cOMR
650 _aElectronic Engineering
700 _aCrouch, Alfred L.
942 _cLBK
999 _c12088
_d12088