| 000 | 00656nam a2200229Ia 4500 | ||
|---|---|---|---|
| 000 | 00497nam a2200133 a 4500 | ||
| 008 | 220704s1997 ||||||||||||||||| || u | ||
| 008 | 240624s9999 xx 000 0 und d | ||
| 020 | _a9788120316836 | ||
| 041 | _aEng | ||
| 050 | _a621.38152 SHA 1997 | ||
| 060 | _a621.38152 SHA 1997 | ||
| 082 | _a621.38152 SHA 1997 | ||
| 100 | _aSharma, Ashok K | ||
| 245 | 0 | _aSemiconductor memories technology, testing, and reliability | |
| 260 |
_aNew Delhi _bPrentice, hall of India _c1997 |
||
| 300 | _a462 p | ||
| 365 |
_b1.8 _cOMR |
||
| 650 | _aElectronic Engineering | ||
| 700 | _aSharma, Ashok K | ||
| 942 | _cLBK | ||
| 999 |
_c46571 _d46571 |
||